3. |
In-situ characterization of exposed e-beam resist using
novel AFM technique |
In this application note, the impact of e-beam exposure
on PMMA (poly-methyl methacrylate) is characterized by an in-situ application
of attocube’s attoAFM III in a Raith eLINE electron beam lithography
system (EBL). |
1422 KB |
2. |
Stress-strain behaviour of fibrous biological material
measured using an AFM/SEM hybrid |
attocube‘s cantilever-based attoAFM I was used inside a FEI Quanta 3D Scanning Electron Microscope (SEM) to perform nanometer-scale tensile measurements of individual collagen fibrils. |
185 KB |
1. |
In-situ AFM measurements of SrTiO3 and Co particles
inside an electron microscope. |
attocube‘s tuning fork based attoAFM III was used inside inside a LEO 1530 scanning electron microscope (SEM) to investigate magnetic Co particles confined in
an organic matrix.. |
157 KB |
