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attoAFM III
low temperature atomic force microscope, tuning fork based
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The attoAFM III is an atomic force microscope designed particularly
for applications at low and ultra low temperature. Due to the non-optical
shear force detection based on a tuning fork, this system is ideally
suited for applications where input of light is problematic. A
typical application of the attoAFM III microscope is Scanning
Gate Microscopy (SGM) on semiconductor structures. This microscope
is also compatible with the commercially available Akiyama probe.
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01 LT and HV compatible feedthroughs
02
vacuum window
03 microscope insert
04 superconducting magnet (optional)
05 liquid He dewar (optional)
06 ultra stable Titanium housing
07 xyz coarse positioners
08 xy scanner
09 sample
10 tuning fork including LT compatible preamplifier |
Scheme of a cryogenic tuning fork based AFM insert including cryostat and superconducting magnet.
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Principle - the attoAFM III uses a tuning fork
sensor as detection mechanism for the tip-sample separation, allowing
high resolution non-contact mode imaging without the need for any
optical deflection detection techniques. In general, an AFM tip
is glued onto one leg of a small quartz tuning fork and forced
to oscillate in horizontal direction with an amplitue of typically
50 pm. Damping of the amplitude due to tip-sample interaction
when approaching the sample is monitored and/or used as a feedback
signal. The force resolution of this technique is typically 0.1
pN.
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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ultra
compact AFM head with unprecedented stability |
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highly sensitive,
non-optical tuning fork sensor |
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LT compatible
preamplifier located in close proximity to tuning fork |
| Benefits
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ultra
high resolution imaging in non-contact mode |
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high Q factor
for highest sensitivity measurements |
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optimized S/N
ratio due to LT compatible preamplifier |
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no optical alignment
necessary |
| Tuning fork AFM image of a patterned Si/SiO-substrate
recorded at 320 mK.Height: 20 ± 2 nm
recorded with the attoAFM III (attocube application
labs, 2007). |
| Tuning fork AFM image of an InAs layer showing monoatomic
steps with a height of 2.04 ± 0.02 Angstrom.
This corresponds well to the atomic lattice constant of InAs,
2.15 Å (attocube application labs, 2007). |
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